Blank Cover Image

Misfit Dislocation Introduction During the Epitaxial Growth of InAs Islands on GaP

著者名:
掲載資料名:
Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
673
発行年:
2001
総ページ数:
6
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558996090 [1558996095]
言語:
英語
請求記号:
M23500/673
資料種別:
国際会議録

類似資料:

1 国際会議録 Dislocation Arrays in the Interfaces Between Substrates and Epitaxial Islands

Lakshmanan, Annamalai, Gopal, Vidyut, King, Alexander H., Kvam, Eric P.

Materials Research Society
7 国際会議録 *THE ROLE OF MISFIT DISLOCATIONS DURING EPITAXIAL GROWTH

Cherns, D.

Materials Research Society
2 国際会議録 Microstructural and Electrical Characterization of Misfit Dislocations at the InAs/GaP Heterointerface

Gopal, V., Chin, T. P., Vasiliev, A. L., Woodall, J. M., Kvam, E. P.

MRS - Materials Research Society
8 国際会議録 MODIFIED DISLOCATION STRUCTURES IN GexSi1-X DOUBLE EPILAYERS ON (001)Si

Kvam, Eric P.

Materials Research Society
3 国際会議録 Sequential operation of three distinct misfit dislocation introduction mechanisms in an epitaxial bilayer film

Gopal, V., Kvam, E. P., Chen, E-H., Woodall, J. M.

MRS-Materials Research Society
9 国際会議録 MICROSTRUCTURAL EXAMINATION OF EXTENDED CRYSTAL DEFECTS IN SILICON SELECTIVE EPITAXIAL GROWTH (SEG)

Yen, Haw, Bashir, Rashid, Kvam, Eric P., Neudeck, Gerold W.

MRS - Materials Research Society
4 国際会議録 NUCLEATION OF DISLOCATIONS IN STRAINED EPITAXIAL LAYERS

Kvam, Eric

Materials Research Society
10 国際会議録 Single variant orientational growth of YBa2Cu3O7-x on vicinal (011) SrTiO3 substrates

Vasiliev, A.L., Linehan, D.S., Kvam, E.P., Hou, L., McElfresh, M.W.

Materials Research Society
5 国際会議録 Unique Defect-Induced Donor Structure at the Lattice Mismatched InAs/GaP Heterointerface

Gopal, V., Chen, E-H., Kvam, E. P., Woodall, J. M.

MRS - Materials Research Society
11 国際会議録 THE NUCLEATION AND PROPAGATION OF MISFIT DISLOCATIONS NEAR THE CRITICAL THICKNESS IN Ge-Si STRAINED EPILAYERS

Kvam, E. P., Eaglesham, D. J., Maher, D. M., Humphreys, C. J., Bean, J. C., Green, G. S., Tanner, B. K.

Materials Research Society
6 国際会議録 MISFIT DISLOCATIONS IN EPITAXIAL LAYERS OF Si ON GaP (001) SUBSTRATES

Viegers, M. P. A., Bulle Lieuwma, C. W. T., Zalm, P. C., Maree, P. M. J.

Materials Research Society
12 国際会議録 Defect Structures in Gap/Si

Samavedam, Srikanth B., Kvam, Eric P., Ford, Greg, Wessels, Bruce W., Chin, T. P., Woodall, Jerry M.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12