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Characterization of the Interfacial Layer Formed During Pulsed Laser Deposition of Oxides on Si

著者名:
掲載資料名:
Transport and microstructural phenomena in oxide electronics : symposium held April 16-20, 2001, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
666
発行年:
2001
総ページ数:
6
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558996021 [1558996028]
言語:
英語
請求記号:
M23500/666
資料種別:
国際会議録

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