High-Resolution Electron Microscopy of Grain Boundary Migration

High-Resolution Electron Microscopy of Grain Boundary Migration

著者名:

掲載資料名:

Influences of interface and dislocation behavior on microstructure evolution : symposium held November 27-30, 2000, Boston, Massachuusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

652

発行年:

2001

総ページ数:

12

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558995628 [1558995625]

言語:

英語

請求記号:

M23500/652

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014537
シリーズID:	PA00000011
会議名:	Symposium on influences of interface and dislocation behavior on microstructure evolution
回次:	2000
会議開催地:	Boston, MA, USA
会議開催年:	2000.11.27-2000.11.30

類似資料:

1 国際会議録 High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia Merkle, K.L., Thompson, L.J., Bai, G.-R., Eastman, J.A. Materials Research Society	7 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY OF GRAIN BOUNDARIES IN NANOPHASE PALLADIUM Thomas, G. J., Siegel, R. W., Eastman, J. A. Materials Research Society
2 国際会議録 Dynamics of Grain Boundary Motion at the Atomic Level Merkle, K.L., Thompson, L.J., Phillipp, F. Materials Research Society	8 国際会議録 QUANTITATIVE HIGH-RESOLUTION ELECTRON MICROSCOPY OF GRAIN BOUNDARIES IN α-Al2O3 Hoche, T., Kenway, P.R., Kleebe, H.-J., Ruhle, M. Materials Research Society
3 国際会議録 ATOMIC RESOLUTION STUDIES OF TILT GRAIN BOUNDARIES IN NiO Merkle, K.L., Reddy, J.F., Wiley, C.L., Smith, D.J., Wood, G.J. Materials Research Society	9 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY OF TWIST GRAIN BOUNDARIES Krakow, William Materials Research Society
4 国際会議録 Atomic Relaxation Modes in Grain Boundaries Merkle,K.L., Wolf,D. Trans Tech Publications	10 国際会議録 High resolution electron microscopy of grain boundaries in silicon Cunningham, B., Ast, D. North-Holland
5 国際会議録 Connections between Grain Boundary Structure and Energy Merkle,K.L., Wolf,D. Trans Tech Publications	11 国際会議録 Quantitative High-Resolution Electron Microscopy of Grain Boundaries Campbell, Geoffrey H., King, Wayne E., Cohen, Dov, Carter, C. Barry MRS - Materials Research Society
6 国際会議録 HIGH-VOLTAGE ELECTRON MICROSCOPY INVESTIGATION OF SUBGRAIN BOUNDARIES IN RECRYSTALLIZED SILICON-ON-INSULATOR STRUCTURES Baumgart, H., Phillipp, F. Materials Research Society	12 国際会議録 Studies on the Vacancy Mobility in α-Iron by High-Voltage Electron Microscopy(HVEM) Phillipp,F. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12