Ion-Implantation Generated Nanovoids in Si and MgO Monitored by High Resolution Positron Beam Analysis
- 著者名:
Eijt, S.W.H. Falub, C.V. Veen, A. van Schut, H. Mijnarends, P.E. Huis, M.A. van Fedorov, A.V. - 掲載資料名:
- Microstructural processes in irradiated materials, 2000 : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 650
- 発行年:
- 2001
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558995604 [1558995609]
- 言語:
- 英語
- 請求記号:
- M23500/650
- 資料種別:
- 国際会議録
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