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Finite Element Modeling of Nanoindentation Measurements of Crystalline and Amorphous Si

著者名:
掲載資料名:
Fundamentals of nanoindentation and nanotribology II : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
649
発行年:
2001
総ページ数:
6
出版情報:
Warrendale, Penn.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995598 [1558995595]
言語:
英語
請求記号:
M23500/649
資料種別:
国際会議録

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