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Pseudo-MOS Operation of Ultra-Narrow Polycrystalline Silicon Wires: Electrical Characterization and Memory Effects

著者名:
Anghel, C.
Hefyene, N.
Ionescu, A. M.
Declercq, M.
Tringe, J. W.
Plummer, J. D.
さらに 1 件
掲載資料名:
Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
638
発行年:
2001
総ページ数:
6
出版情報:
Warrendale, PA.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995482 [155899548X]
言語:
英語
請求記号:
M23500/638
資料種別:
国際会議録

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