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Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology

著者名:
Zollner, Stefan
Konkar, Atul
Liu, Ran
Yapa, Himansu
Dryer, Patricia F.
Neeley, Victoria A.
Xie, Qianghua
Grom, Galina F.
Zhu, Qingyuan
Krishnan, Rishikesh
Fauchet, Philippe M.
Tsybeskov, Leonid V.
さらに 7 件
掲載資料名:
Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
638
発行年:
2001
総ページ数:
6
出版情報:
Warrendale, PA.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995482 [155899548X]
言語:
英語
請求記号:
M23500/638
資料種別:
国際会議録

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