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Transmission Electron Microscopy Characterization of Microstructure and TiN Precipitation In Low-Energy Nitrogen Ion Implanted V-Ti Alloys.

著者名:
Ortiz, M. I.
Garcia, J. A.
Varela, M.
Riviere, J. P.
Rodriguez, R.
Ballesteros, C.
さらに 1 件
掲載資料名:
Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
875
発行年:
2005
開始ページ:
403
終了ページ:
408
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998292 [1558998292]
言語:
英語
請求記号:
M23500/875
資料種別:
国際会議録

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