High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics

High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics

著者名:

Ziegler, A.

掲載資料名:

Electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure : symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

839

発行年:

2005

開始ページ:

23

終了ページ:

28

総ページ数:

6

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997875 [1558997873]

言語:

英語

請求記号:

M23500/839

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014492
シリーズID:	PA00000011
会議名:	Symposium on electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure
回次:	2004
会議開催地:	Boston, MA, USA
会議開催年:	2004.11.29-2004.12.01

類似資料:

1 国際会議録 Effects of the Amorphous Oxide Intergranular Layer Structure and Bonding on the Fracture Toughness of a High Purity Silicon Nitride Ziegler, A., Kisielowski, C., Hoffmann, M.J., Ritchie, R.O. Materials Research Society	7 国際会議録 Atomic Structure of Interfaces in Silicon Nitride Laval,J.Y., Thorel,A. Trans Tech Publications
2 国際会議録 Probing the Electronic Properties of Interfaces and Defects on the Atomic Scale N. D. Browning, I. Arslan, J.-C. Idrobo, R. F. Klie Electrochemical Society	8 国際会議録 ATOMIC-RESOLUTION CHEMICAL ANALYSIS AT 100 kV IN THE SCANNING TRANSMISSION ELECTRON MICROSCOPE Browning, N. D., Chisholm, M. F., Pennycook, S. J. MRS - Materials Research Society
3 国際会議録 Determination of Atomic Structure at Surfaces and Interfaces by High-Resolution STEM Pennycook, S. J., Nellist, P. D., Chisholm, M. F., Browning, N. D., Wallis, D. J., Dickey, E. C. MRS - Materials Research Society	9 国際会議録 Characterization of nitrided silicon-silicon dioxide interfaces Polignano, M. L., Alessandri, M., Brazzelli, D., Crivelli, B., Ghidini, G., Zonca, R., Caricato, A. P., Bersani, M., … MRS-Materials Research Society
4 国際会議録 High Resolution Electron Microsopy Studies on sillicon Nitride Ceramics Kleebe -J. H., Cinibulk K. M., Tanaka I., Bruley J., Vetrono S. J., Ruhle M. Kluwer Academic Publishers	10 国際会議録 Analysis of fhe Atomic-Scale Defect Chemistry at Interfaces in Fluorite Structured Oxides by Electron Energy Loss Spectroscopy Ito, Y., Lei, Y, Browning, N.D., Mazanec, T.J. Materials Research Society
5 国際会議録 *HIGHRESOLUTION ELECTRON MICROSCOPY OBSERVATIONS OF GRAIN-BOUNDARY FILMS IN SILICON NITRIDE CERAMICS Kleebe, H.-J., Cinibulk, M.K., Tanaka, I., Bruley, J., Cannon, R.M., Clarke, D.R., Hoffmann, M.J., Ruhle, M. Materials Research Society	11 国際会議録 HIGH-RESOLUTION MICROSCOPY OF CERAMICS Carter, C.B., McKernan, S., Rasmussen, D.R., Simpson, Y.K., Summerfelt, S.R., Susnitzky, D.W., Tietz, L.A. Materials Research Society
6 国際会議録 On the Effect of Local Grain-Boundary Chemistry on the Macroscopic Mechanical Properties of a High Purity Y2O3-Al2O3-Containing Silicon Nitride Ceramic Ziegler, A., McNaney, J. M., Hoffmann, M. J., Ritchie, R. O. Materials Research Society	12 国際会議録 High Resolution X-ray Diffraction Analysis of Gallium Nitride Grown on Sapphire by Halide Vapor Phase Epitaxy Matyi, R. J., Zhi, D., Perkins, N. R., Horton, M. N., Kuech, T. F. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12