Roughness Analysis of Ion Beam Processed GaSb and InSb Surfaces
- 著者名:
Krishnaswami, K. Fenner, D. B. Vangala, S. R. Santeufemio, C. Grzesik, M. Allen, L. P. Dallas, G. Goodhue, W. D. - 掲載資料名:
- Progress in compound semiconductor materials -- electronic and optoelectronic applications
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 829
- 発行年:
- 2004
- 開始ページ:
- 273
- 終了ページ:
- 278
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997776 [1558997776]
- 言語:
- 英語
- 請求記号:
- M23500/829
- 資料種別:
- 国際会議録
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