Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys Measured by Atomic Force Microscopy

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys Measured by Atomic Force Microscopy

著者名:

掲載資料名:

Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

803

発行年:

2004

開始ページ:

179

終了ページ:

184

総ページ数:

6

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997417 [1558997415]

言語:

英語

請求記号:

M23500/803

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014475
シリーズID:	PA00000011
会議名:	Symposium on advanced data storage materials and characterization techniques
回次:	2003
会議開催地:	Boston, MA, USA
会議開催年:	2003.12.01-2003.12.04

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