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Analysis of InGaN-GaN Quantum Well Chemistry and Interfaces by Transmission Electron Microscopy and X-ray Scattering

著者名:
掲載資料名:
GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
798
発行年:
2004
開始ページ:
787
終了ページ:
792
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997363 [1558997369]
言語:
英語
請求記号:
M23500/798
資料種別:
国際会議録

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