Determining Stress-Strain Curves for Thin Films by Experimental/Computational Nanoindentation
- 著者名:
- 掲載資料名:
- Thin films : stresses and mechanical properties X : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 795
- 発行年:
- 2002
- 開始ページ:
- 345
- 終了ページ:
- 350
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997332 [1558997334]
- 言語:
- 英語
- 請求記号:
- M23500/795
- 資料種別:
- 国際会議録
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