Modeling of Pattern Density Dependent Pressure Non-Uniformity at a Die Scale for ILD Chemical Mechanical Planarization
- 著者名:
- 掲載資料名:
- Advances in chemical-mechanical polishing : symposium held April 13-15, 2004, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 816
- 発行年:
- 2004
- 開始ページ:
- 101
- 終了ページ:
- 106
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997660 [1558997660]
- 言語:
- 英語
- 請求記号:
- M23500/816
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Materials Research Society |
Materials Research Society |
8
国際会議録
Low-k Dielectric Material Chemical Mechanical Polishing Process Monitoring Using Acoustic Emission
MRS - Materials Research Society |
Electrochemical Society |
Materials Research Society |
American Institute of Chemical Engineers |
Electrochemical Society |
American Institute of Chemical Engineers |
Materials Research Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |