Structural Properties of SiGe Islands: Effect of Capping

Structural Properties of SiGe Islands: Effect of Capping

著者名:

Stangl, Julian

掲載資料名:

Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

749

発行年:

2003

開始ページ:

403

終了ページ:

414

総ページ数:

12

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996861 [1558996869]

言語:

英語

請求記号:

M23500/749

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014409
シリーズID:	PA00000011
会議名:	Symposium on morphological and compositional evolution of thin films
回次:	2002
会議開催地:	Boston, MA, USA
会議開催年:	2002.12.02-2002.12.05

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