Influence of Ta2O5, TiO2, and ZrO2 Interfacial Layers on Structural and Electrical Properties of Laser Ablated Ba0.5Sr0.5TiO3 Thin Films

Influence of Ta2O5, TiO2, and ZrO2 Interfacial Layers on Structural and Electrical Properties of Laser Ablated Ba0.5Sr0.5TiO3 Thin Films

著者名:

掲載資料名:

Ferroelectric thin films XI : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

748

発行年:

2003

開始ページ:

429

終了ページ:

434

総ページ数:

6

出版情報:

Warrendale, Pa: Materials Research Society

ISSN:

02729172

ISBN:

9781558996854 [1558996850]

言語:

英語

請求記号:

M23500/748

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014408
シリーズID:	PA00000011
会議名:	Symposium on ferroelectric thin films
回次:	11th
会議開催地:	Boston, MA, USA
会議開催年:	2002.12.02-2002.12.05

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