Back-gate induced noise overshoot in partially-depleted SOI MOSFETs
- 著者名:
- 掲載資料名:
- Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment
- シリーズ名:
- NATO science series. Series 2, Mathematics, physics and chemistry
- シリーズ巻号:
- 185
- 発行年:
- 2005
- 開始ページ:
- 255
- 終了ページ:
- 260
- 総ページ数:
- 6
- 出版情報:
- Dordrecht: Kluwer Academic Publishers
- ISBN:
- 9781402030116 [1402030118]
- 言語:
- 英語
- 請求記号:
- N17050/185
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
Electrochemical Society |
ESA Publication Division |
Kluwer Academic Publishers |
Electrochemical Society |
Electrochemical Society | |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
12
国際会議録
HALO Effects on 0.13 μm Floating-Body Partially Depleted SOI n-MOSFETs iII Low Temperature Operation
Electrochemical Society |