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Sensitivity of a Rotating Beam Sensor for Stress Evaluation in Aluminum Thin Films

著者名:
Santos, J. M. M. dos
Pina, J. C. P.
Batista, A. C.
Horsfall, A. B.
Wang, K.
Wright, N. G.
Soare, S. M.
Bull, S. J.
O'Neill, A. G.
Terry, J. G.
Walton, A. J.
Gundlach, A. M.
Stevenson, J. T. M.
さらに 8 件
掲載資料名:
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004
シリーズ名:
Materials science forum
シリーズ巻号:
490-491
発行年:
2005
開始ページ:
649
終了ページ:
654
総ページ数:
6
出版情報:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499694 [0878499695]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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