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Depth Profile of Titanium Alloy (Ti-6Al-4V) and Residual Stress Measured by Using X-Ray Diffraction after Metal Cutting Assisted by High-Pressured Jet Cooling Evaluation of Etching Methods: ION Beam (EDOS) and Electro-Chemical Etching

著者名:
掲載資料名:
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004
シリーズ名:
Materials science forum
シリーズ巻号:
490-491
発行年:
2005
開始ページ:
545
終了ページ:
551
総ページ数:
7
出版情報:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499694 [0878499695]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

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