Blank Cover Image

Study of Carbon in Thermal Oxide Formed on 4H-SiC by XPS

著者名:
Zhao, Rusli, P.
Xia, J. H.
Tan, C. M.
Liu, Y.
Tin, C. C.
Yoon, S. F.
Zhu, W. G.
Ahn, J.
さらに 3 件
掲載資料名:
Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy
シリーズ名:
Materials science forum
シリーズ巻号:
483-485
発行年:
2005
開始ページ:
653
終了ページ:
656
総ページ数:
4
出版情報:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499632 [0878499636]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

1 国際会議録 Physical Simulation of Drain-Induced Barrier Lowering Effect in SiC MESFETs

Zhu, C., Rusli, L., Almira, J., Tin, C. C., Yoon, S. F., Ahn, J.

Trans Tech Publications
7 国際会議録 Ellipsometric and XPS Studies of 4H-SiC/SiO2 Interfaces, and Sacrificial Oxide Stripped 4H-SiC Surfaces

Guy, O.J., Chen, L., Pope, G., Teng, K.S., Maffeis, T., Wilks, S.P., Mawby, P.A., Jenkins, T., Brieva, A., Hayton, D.J.

Trans Tech Publications
2 国際会議録 An XPS study of silicon oxynitride rapid thermally grown in nitric oxide

Lai, W. H., Li, M. F., Pan, J. S., Liu, R., Chan, L., Chua, T. C.

MRS-Materials Research Society
8 国際会議録 Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC

Bardeleben, H. J. von, Cantin, J. L., Vickridge, I., Song, Y., Dhar, S., Feldman, L. C., Williams, J. R., Ke, L., …

Trans Tech Publications
3 国際会議録 Reactive lon Etching Induced Surface Damage of Silicon Carbide

Xia, J., Rusli, H., Gopalakrishan, R., Choy, S. F., Tin, C. C., Ahn, J., Yoon, S. F.

Trans Tech Publications
9 国際会議録 An XPS Study of the Passive Film Formed on Pure Mo and MoSi2 in 4M HCI

G. P. Halada, C. R. Clayton, H. Herman, S. Sampath, R. Tiwari

Electrochemical Society
4 国際会議録 Field-Plate Terminated Pt/n- 4H-SiC SBD Using Thermal SiO2 and Sputter Deposited AIN Dielectric Stack

A. Kumta, E. Rusli, J.H. Xia

Trans Tech Publications
10 国際会議録 Micro-Raman Investigation of Defects in a 4H-SiC Homoepilayer

X.F. Liu, G.S. Sun, J.M. Li, Y.M. Zhao, J.Y. Li, L. Wang, W.S. Zhao, M.C. Luo, Y.P. Zeng

Trans Tech Publications
5 国際会議録 Catalytic formation of carbon nanotubes on Fe-loading molecular sieves materials : An XPS study

He, N. -Y., Yang, C., Xiao, P. -F., Wang, G. -H., Zhao, Y. -J., Lu, Z. -H., Yuan, C. -W.

Elsevier
11 国際会議録 SCANNING ATOMIC FORCE MICROSCOPY AND SCANNING ELECTRON MICROSCOPY STUDY OF DIAMOND THIN FILMS GROWN BY MICROWAVE PLASMA ENHANCED CHEMICAL VAPOUR DEPOSITION

Ahn, Jaeshin, Tan, F.H., Tan, H.S., Zhu, W.

Materials Research Society
6 国際会議録 Surface Studies on Thermal Oxidation on 4H-SiC Epilayer

Koh, A., Kestle, A., Wilks, S. P., Dunstan, P. R., Wright, C. J., Pritchard, M., Pope, G., Mawby, P. A., Bowen, W. R.

Trans Tech Publications
12 テクニカルペーパー Elevated Temperature Formability of Some Engineering Metals For Gas Forming of Automotive Structures

X. Wu, H. Hao, Y. Liu, F. Zhu, J. Jiang, R. Krishnamurthy, S. Wang, P. E. Smith, W. Bland, G. D. Pfaffmann

Society of Automotive Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12