Investigation of Stacking Fault Formation in Hydrogen Bombarded 4H-SiC

Investigation of Stacking Fault Formation in Hydrogen Bombarded 4H-SiC

著者名:

Galeckas, A.

Kortegaard Nielsen, H.

掲載資料名:

Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy

シリーズ名:

Materials science forum

シリーズ巻号:

483-485

発行年:

2005

開始ページ:

327

終了ページ:

330

総ページ数:

4

出版情報:

Uetikon-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499632 [0878499636]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014242
シリーズID:	PA00000012
会議名:	ECSCRM : European Conference on Silicon Carbide and Related Materials
回次:	2004 : 5th
会議開催地:	Bologna, Italy
会議開催年:	2004.08.31-2004.09.04

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1 国際会議録 Investigation of Structural Stability in 4H-SiC Structures with Heavy Ion Implanted Interface Galeckas, A., Hallen, A., Schoner, A., Linnros, J., Pirouz, P. Trans Tech Publications	7 国際会議録 Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes Galeckas, A., Linnros, J., Breitholtz, B. Trans Tech Publications
2 国際会議録 M-Center in Low-Dose Proton Implanted 4H-SiC; Bistability and Change in Emission Rate Kortegaard Nielsen, H., Hallen, A., Martin, D. M., Svensson, B. G. Trans Tech Publications	8 国際会議録 Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes Galeckas, A., Linnros, J., Breitholtz, B. Trans Tech Publications
3 国際会議録 In Situ Studies of Structural Instability in Operating 4H-SiC PiN Diodes Galeckas, A., Linnros, J., Pirouz, P. Trans Tech Publications	9 国際会議録 Optical Characterization of 4H-SiC p+n-n+ Structures Applying Time- and Spectrally Resolved Emission Microscopy Galeckas, A., Linnros, J., Breitholtz, B. Trans Tech Publications
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