Blank Cover Image

Electrical Impact of SiC Structural Crystal Defects on High Electric Field Devices

著者名:
Neudeck, P. G.  
掲載資料名:
Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999
シリーズ名:
Materials science forum
シリーズ巻号:
338-342(2)
発行年:
2000
開始ページ:
1161
終了ページ:
1166
総ページ数:
6
出版情報:
Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498543 [0878498540]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

1 国際会議録 Nonmicropipe Dislocations in 4H-SiC Devices: Electrical Properties and Device Technology Implications

Neudeck, P. G., Huang, W., Dudley, M., Fazi, C.

MRS - Materials Research Society
7 国際会議録 Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

Weisser, M., Seitz, C., Wellmann, P.J., Hock, R., Magerl, A.

Trans Tech Publications
2 国際会議録 Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

Dudley, M., Huang, X., Vetter, W.M., Neudeck, P.G.

Trans Tech Publications
8 国際会議録 Material Defects and Rugged Electrical Power Switching in Semiconductors

K. Shenai, P.G. Neudeck, M. Dudley, R.F. Davis

Trans Tech Publications
3 国際会議録 A Reduction of Defects in the SiO2-SiC System Using the SiC Vacuum Field-Effect Transistor (VacFET)

K.M. Speer, P.G. Neudeck, M. Mehregany

Trans Tech Publications
9 国際会議録 Impact of SiC Structural Defects on the Degradation Phenomenon of Bipolar SiC Devices

Malhan, R.K., Nakamura, H., Onda, S., Nakamura, D., Hara, K.

Trans Tech Publications
4 国際会議録 Investigations Of Non-Micropipe X-Ray Imaged Crystal Defects In SiC Devices

Neudeck, Philip G., Kuczmarski, Maria A., Dudley, Michael, Vetter, William M., Su, Haibin B., Keys, Luann J., Trunek, …

Materials Research Society
10 国際会議録 CHARACTERIZATION OF DEFECT STRUCTURES IN LELY 6H-SiC SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY

Huang, W., Wang, S., Dudley, M., Neudeck, P., Powell, J. A., Fazi, C.

MRS - Materials Research Society
5 国際会議録 Structural Defects and Critical Electric Field in 3C-SiC

Capano, M.A., Smith, A.R., Kim, B.C., Kvam, E.P., Tsoi, S., Ramdas, A.K., Cooper, J.A.

Trans Tech Publications
11 国際会議録 Relaxation Mechanism of the Defect-Free 3C-SiC Epitaxial Films Grown on Step-Free 4H SiC Mesas

Du, H., Skowronski, M., Neudeck, P.G., Trunek, A.J., Spry, D.J., Powell, J.A.

Trans Tech Publications
6 国際会議録 High Breakdown Field p-Type 3C-SiC Schottky Diodes Grown on Step-Free 4H-SiC Mesas

Spry, D.J., Trunek, A.J., Neudeck, P.G.

Trans Tech Publications
12 国際会議録 Defect Modeling and Simulation of 4H-SiC P-N Diode

Keskar, N., Shenai, K., Neudeck, P.

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12