Electron Beam Induced Current Investigation of High-Voltage 4H Silicon Carbide Diodes

Electron Beam Induced Current Investigation of High-Voltage 4H Silicon Carbide Diodes

著者名:

Osterman, J.

掲載資料名:

Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999

シリーズ名:

Materials science forum

シリーズ巻号:

338-342(1)

発行年:

2000

開始ページ:

777

終了ページ:

780

総ページ数:

4

出版情報:

Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878498543 [0878498540]

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014226
シリーズID:	PA00000012
会議名:	International Conference on Silicon Carbide and Related Materials : ICSCRM
回次:	1999
会議開催地:	Research Triangle Park, North Carolina, USA
会議開催年:	1999.10.10-1999.10.15

類似資料:

1 国際会議録 Electrical and Optical Characterisation of High Voltage 4H Silicon Carbide Diodes Hallen, A., Zimmermann, U., Osterman, J., Galeckas, A., Linnros, J., Breitholtz, B. Electrochemical Society	7 国際会議録 Investigation of Excess Carrier Distributions in 4H-SiC Power Diodes under Static Conditions and Turn-On Tomblad,O., Galeckas,A., Linnros,J., Breitholtz,B., Lindefelt,U. Trans Tech Publications
2 国際会議録 Current Voltage Characteristics of High-Voltage 4H Silicon Carbide Diodes Zimmermann, U., Hallen, A., Breitholtz, B. Trans Tech Publications	8 国際会議録 Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes Galeckas, A., Linnros, J., Breitholtz, B. Trans Tech Publications
3 国際会議録 SEM Visibility of Stacking Faults in 4H-Silicon Carbide Epitaxial and Implanted Layers Zimmermann, U., Osterman, J., Galeckas, A., Hallen, A. Trans Tech Publications	9 国際会議録 Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes Galeckas, A., Linnros, J., Breitholtz, B. Trans Tech Publications
4 国際会議録 Electrical Characterization of High-Voltage 4H-SiC Diodes on High-Temperature CVD-Grown Epitaxial Layers Zimmermann, U., Osterman, J., Zhang, J., Henry, A., Hallen, A. Trans Tech Publications	10 国際会議録 Investigation of Electroluminescence across 4H-SiC p+/n-/n+ Structures Using Optical Emission Microscopy Galeckas, A., Linnros, J., Breitholtz, B., Bleichner, H. Trans Tech Publications
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