Blank Cover Image

Removal Rate, Uniformity and Defectivity Studies of Chemical Mechanical Polishing of BPSG Films

著者名:
掲載資料名:
Chemical mechanical polishing 2000 -- fundamentals and materials issues : symposium held April 26-27, 2000, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
613
発行年:
2001
開始ページ:
E8.6
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558995215 [1558995218]
言語:
英語
請求記号:
M23500/613
資料種別:
国際会議録

類似資料:

Bonner, B.A., Fishkin, B., David, J., Garretson, C., Osterheld, T.H.

Materials Research Society

Z. Liu, J. Bian

Electrochemical Society

Bennett, D., Bonner, B., Garretson, C., Huey, S., Jin, R. R., McKeever, P., Osterheld, T. H., Zuniga, S.

Materials Research Society

Lee, Jeffrey A., Moinpour, Mansour, Liou, Huey-Chiang, Abell, Thomas

Materials Research Society

Nguyen,V.H., Shi,F.G.

SPIE-The International Society for Optical Engineering

Ho-Cheng, H., Chen, C.C.

Trans Tech Publications

Lee, Brian, Gan, Terence, Boning, Duane S., David, Jeffrey, Bonuer, Benjamin A., McKeever, Peter, Osterheld, Thomas H.

Materials Research Society

Huynh, C., Rutten, M., Cheek, R., Linde, H.

Electrochemical Society

Sivaram,. S., Tolles, R., Bath, H., Lee, E., Leggett

Materials Research Society

J.H. An, G.S. Lee, W.J. Lee, B.C. Shin, J.D. Seo

Trans Tech Publications

Chen, Hsueh-Chung, Wu, Juan Yuan, Lur, Water

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12