Blank Cover Image

High-Temperature Mechanical Behavior And Phase Morphology Of Poly(tetrafluoroethylene)/siloxane Nanocomposites Used As Ultra Low-k Dielectrics

著者名:
掲載資料名:
Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
612
発行年:
2001
開始ページ:
D5.8
出版情報:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558995208 [155899520X]
言語:
英語
請求記号:
M23500/612
資料種別:
国際会議録

類似資料:

Coffer, J.L., Zerda, W., Taylor, K.J., Martin, S.

Materials Research Society

W.L. Cui, J.L. Gu, B.Z. Bai, H.S. Fang

Trans Tech Publications

Zerda, Adam S., Lesser Alan J.

Materials Research Society

Noguchi, T., Kim, D.Y., Kwon, J.Y., Park, K.B., Jung, J.S., Xianyu, W.X., Yin, H.X., Cho, H.S.

Materials Research Society

Yasmin, A., Abot, J.L., Daniel, I.M.

Society of Manufacturing Engineers

M.K. Jain, G.A. Dixit, M.F. Chisholm, T.R. Seha, K.J. Taylor

Society of Photo-optical Instrumentation Engineers

Saxena, R., Cho, W., Rodriguez, O., Gill, W.N., Plawsky, J.L.

Materials Research Society

Pau,S., Cirelli,R.A., Bolan,K.J., Timko,A.G., Frackoviak,J., Watson,G.P., Trimble,L.E., Blatchford,J.W., Nalamasu,O.

SPIE - The International Society for Optical Engineering

Smith,J.L., Motomatsu,S.E., Taylor,J.G., Jefferson,K.J., Stallard,B.R.

SPIE-The International Society for Optical Engineering

Pickup, C., Cochrane, R.W., Brebner, J.L.

Materials Research Society

M. Rauf Gungor, James J. Watkins, Dimitrios Maroudas

American Institute of Chemical Engineers

Dawkins, J. V., Taylor, G., Baker, S. P., Collett, R. W. R., Higgins, J. S.

American Chemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12