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Effects Of Buried Insulator-Sensor Interface On The Lateral Conduction Of High Fill Factor a-Si:H Imagers

著者名:
Boyce, J. B.
Ho, J.
Lau, R.
Lemmi, F.
Lu, J. P.
Mulato, M.
Ready, S. E.
Street, R. A.
VanSchuylenbergh, K.
さらに 4 件
掲載資料名:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
609
発行年:
2001
開始ページ:
A12.8
出版情報:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558995178 [155899517X]
言語:
英語
請求記号:
M23500/609
資料種別:
国際会議録

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