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The Development of Risk Profiles and Their Value in making Business Decisions

著者名:
Sepeda, Adrian L.  
掲載資料名:
Risk, reliability, and security : Center for Chemical Process Safety 17th International Conference and Workshop : October 8-11 2002, Adam's Mark Jacksonville, Jacksonville, Florida
シリーズ名:
AIChE Conference Proceedings
発行年:
2002
開始ページ:
435
終了ページ:
452
総ページ数:
18
出版情報:
New York: American Institute of Chemical Engineers
ISBN:
9780816908806 [081690880X]
言語:
英語
請求記号:
A07755/200105
資料種別:
国際会議録

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