Blank Cover Image

Hot Carrier Degradation in Submicron CMOS Technologies: A Comparative Study

著者名:
掲載資料名:
Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
1994-29
発行年:
1994
開始ページ:
277
終了ページ:
285
総ページ数:
9
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770880 [1566770882]
言語:
英語
請求記号:
E23400/950680
資料種別:
国際会議録

類似資料:

Lie,D.Y.C., Xia,W., Yota,J., Joshi,A.B., Zwingman,R., Williams,R., Kerametlian,V., Cerney,D., Min,B.W., Kwong,D.L.

SPIE-The International Society for Optical Engineering

Miles, G.L., Grellner, F., Jamison, P.C.

Electrochemical Society

Ho,C.S., Pey,K.L., Wong,H., Karunasiri,R.P.G., Chua,S.J., Lee,K.H., Tang,Y., Wong,S.M., Chan,L.H.

SPIE-The International Society for Optical Engineering

Lee, J-W, Kim, H-K, Lee, W-H, Oh, M-R, Kob, Y-H

Electrochemical Society

Saha, S., Yeh, C. S., Lindorfer, Ph., Luo, J., Nellore, U., Gadepally, B.

MRS - Materials Research Society

Seo, Y. J., Choi, W. S., Kim, S. Y., Kim, C. I., Chang, E. G., Lee, W. S.

MRS - Materials Research Society

Kizilyalli,I.C., Abein,G., Chen,Z., Weber,G.R., Register,F., Harris,E., Chetlur,S., Higashi,G.S., Schofieled,M., Sen,S., …

SPIE-The International Society for Optical Engineering

Simoen, E., Rafi, J.M., Mercha, A., De Meyer, K., Claeys, C., Kokkoris, M., Kossionides, E., Fanourakis, G., …

Electrochemical Society

Renn, S.H., Pelloie, J.L., Balestra, F.

Electrochemical Society

Simoen, E., Rafi, J.M., Mercha, A., Serra-Gallifa, X., van Meer, H., De Meyer, K., Claeys, C., Kokkoris, M., …

Electrochemical Society

Rot, P. K., Kook, T., Kannan, V. C., Felton, G. J., Powell, R. A., Velaga, A. N.

Materials Research Society

Yao,P., Zeng,X., Lo,K.F., Guo,Q., Tan,P.Y.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12