Evidence For Non-Uniform Trap Distributions In Thin Oxides After High Voltage Stressing

Evidence For Non-Uniform Trap Distributions In Thin Oxides After High Voltage Stressing

著者名:

掲載資料名:

Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

1994-16

発行年:

1994

開始ページ:

136

終了ページ:

145

総ページ数:

10

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566770484 [1566770483]

言語:

英語

請求記号:

E23400/942240

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014125
シリーズID:	PA00000028
会議名:	Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
回次:	3rd
会議開催地:	San Francisco, CA, USA
会議開催年:	1994.05.23-1994.05.27

類似資料:

1 国際会議録 The Use Of Wearout Measurements To Analyze And Predict TDDB Distributions In Thin Silicon Oxides Dumin, D.J., Mopuri, S., Natarajan, R., Scott, R.S., Subramoniam, R., Lewis, T.G. Electrochemical Society	7 国際会議録 Wearout And Breakdown In Thin Silicon Oxide Dumin, D.J. Electrochemical Society
2 国際会議録 Voltage And Fluence Dependence Of Stress Generated Traps Inside Thin Silicon Oxide Scott, R.S., Dumin, D.J. Electrochemical Society	8 国際会議録 VOLTAGE, FLUENCE, AND POLARITY DEPENDENCE OF TRAP GENERATION INSIDE OF THIN SILICON OXIDE FILMS Scott, Ronald S., Dumin, David J. Materials Research Society
3 国際会議録 MEASUREMENT OF HIGH VOLTAGE STRESS INDUCED TRAPS INSIDE THIN SILICON OXIDE FILMS Dumin, D.J., Maddux, J.R. Materials Research Society	9 国際会議録 The Transient Nature Of Excess Low-Level Leakage Currents In Thin Oxides Scott, R.S., Dumin, D.J. Electrochemical Society
4 国際会議録 The Search for Cathode and Anode Traps in High-Voltage Stressed Sillicon Oxides Chen, L., Kang, C.S., Oralkan, O., Dumin, D.J., Brown, G.A., Bellutti, P. Electrochemical Society	10 国際会議録 STRESS INDUCED INCREASED LOW LEVEL LEAKAGE IN THIN OXIDES Dumin, D.J., Maddux, J.R., Wong, D.-P. Materials Research Society
5 国際会議録 TRANSIENT FLAT-BAND VOLTAGE SHIFTS FOLLOWING HIGH VOLTAGE STRESSING OF THIN OXIDES Wong, D.P., Dumin, D.J. Materials Research Society	11 国際会議録 Traps In Reoxidized Nitrided Oxides Of Varying Thicknesses Natarajan, B., Dumin, D.J. Electrochemical Society
6 国際会議録 COMPARISON OF THE DENSITY AND DISTRIBUTION OF TRAPS GENERATED BY HIGH VOLTAGE STRESS IN SILICON OXIDE AND SILICON OXYNITRIDES Richardson, J.T., Dumin, D.J., Lo, G.Q., Kwong, D.L., Gross, B.J., Sodini, C.G. Materials Research Society	12 国際会議録 A Comprehensive Physical Model of Oxide Wearout and Breakdown Explaining the Fluence, Time, Field, and Dependence of Trap Generation Thickness Quian, D., Dumin, D.J. Electrochemical Society

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