Behaviour of buried oxides in SOl-SIMOX transistors under ionizing radiation

Behaviour of buried oxides in SOl-SIMOX transistors under ionizing radiation

著者名:

掲載資料名:

Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

1994-11

発行年:

1994

開始ページ:

367

終了ページ:

374

総ページ数:

8

出版情報:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566770439 [1566770432]

言語:

英語

請求記号:

E23400/941388

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014120
シリーズID:	PA00000028
会議名:	International Symposium on Silicon-on-Insulator Technology and Devices ; Electrochemical Society Meeting
回次:	6th ; 185th
会議開催地:	San Francisco, CA, USA
会議開催年:	1994.05.22-1994.05.27

類似資料:

1 国際会議録 Post-irradiation evolution of SOI-SIMOX MOS transistors parameters Berland, V., Touboul, A., Flament, O. Electrochemical Society	7 国際会議録 FTIR reflectance characterization of SIMOX buried oxide layers Yakovlev, Victor A., Charpenay, Sylvie, Rosenthal, Peter A., Solomon, Peter R., Xu, Jiazan SPIE
2 国際会議録 RADIATION HARDENING OF SIMOX BURIED OXIDE BY NITRIDATION Karulkar, Pramod C., Wyatt, P.W. Materials Research Society	8 国際会議録 Cryogenic investigations of SIMOX buried oxide parameters Lysenko, V.S., Tyagulski, I.P., Osiyuk, I.N., Gomeniuk, Y.V. Kluwer Academic Publishers
3 国際会議録 RADIATION-INDUCED OXIDE CHARGE DISTRIBUTIONS IN SIMOX BURIED OXIDES Hwang, J. M., Bartko, J., Rai-Choudhury, P., Bailey, W. E. Materials Research Society	9 国際会議録 Implications of thin buried-oxide for SIMOX circuit performance Alles, M., Krull, W., Allen, L. Electrochemical Society
4 国際会議録 Effect of supplemental dose in SIMOX on very high ionizing dose response Flament, O., Paillet, P., Leray, J.L., Aspar, B., Giffard, B., Auberton-Herve, A.J. Electrochemical Society	10 国際会議録 Degradation and relaxation of the buried oxide in SIMOX-MOSFET's Karmann, A., Reimbold, G., Cristoloveanu, S. Electrochemical Society
5 国際会議録 Electrochemical analysis of SIMOX buried oxides Allen, L P, Anc, M J, Duffy, M, Parechanian, J H, Yap, J H Electrochemical Society	11 国際会議録 Analysis of Ordered Structure of Buried Oxide Layers in SIMOX Wafers Shimura, T, Ejiri, R, Hosoi, T, Umeno, M Electrochemical Society
6 国際会議録 Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors Xiong, H.D., Fleetwood, D.M., Schwank, J.R. SPIE-The International Society for Optical Engineering	12 国際会議録 Experimental investigations of thermal conductivity of buried oxides in SIMOX and BESOI wafers Tenbroek, B.M., Whiting, G., Lee, M.S.L., Edwards, C.F., Redman-White, W. Electrochemical Society

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