Temperature Dependence of Effective Lifetime for N-Type Silicon Wafers: Metastable Surface Recombination Centers
- 著者名:
- 掲載資料名:
- Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1994-1
- 発行年:
- 1994
- 開始ページ:
- 265
- 終了ページ:
- 274
- 総ページ数:
- 10
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770378 [1566770378]
- 言語:
- 英語
- 請求記号:
- E23400/941393
- 資料種別:
- 国際会議録
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1
国際会議録
Lifetime Identification of Thermal Oxidation Process Induced Contamination in Silicon Wafers
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