Reliability Issues for Submicron Interconnects and Vias
- 著者名:
- Thompson, C.V.
- 掲載資料名:
- Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 1994-1
- 発行年:
- 1994
- 開始ページ:
- 176
- 終了ページ:
- 180
- 総ページ数:
- 5
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770378 [1566770378]
- 言語:
- 英語
- 請求記号:
- E23400/941393
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
12
国際会議録
RELIABILITY OF INTERCONNECTS EXHIBITING BIMODAL ELECTROMIGRATION-INDUCED FAILURED DISTRIBUTIONS
Materials Research Society |