Band Alignment Issues in Metal/Dielectric Stacks: A Combined Photoemission and Inverse Photoemission Study of the HfO2/Pt and HfO2/Hf Systems
- 著者名:
Sayan, S. Bartynski, R.A. Robertson, J. Suehle, J.S. Vogel, E. Nguyen, N.V. Ehrstein, J. Kopanski, J.J. Suzer, S. Holl, M.B. Garfunkel, E. - 掲載資料名:
- Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2004-01
- 発行年:
- 2004
- 開始ページ:
- 255
- 終了ページ:
- 263
- 総ページ数:
- 9
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774062 [1566774063]
- 言語:
- 英語
- 請求記号:
- E23400/200401
- 資料種別:
- 国際会議録
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