Reports data obtained from a non-contact technique based on pulsed corona charging and time resolved voltage measurements.
- 著者名:
- wilson
- 掲載資料名:
- Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2003-22
- 発行年:
- 2003
- 開始ページ:
- 425
- 終了ページ:
- 440
- 総ページ数:
- 16
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774055 [1566774055]
- 言語:
- 英語
- 請求記号:
- E23400/200322
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
9
国際会議録
Advanced FRET and FCS measurements with laser scanning microscopes based on time-resolved techniques
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |