Fusion-Bonded Multilayered SOI for MEMS Applications
- 著者名:
Somasundram, K. McCann, P. Cole, D. McNamara, C. Boyle, A. Devine, C. Brown, A. Nevin, A. - 掲載資料名:
- Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2003-19
- 発行年:
- 2003
- 開始ページ:
- 288
- 終了ページ:
- 300
- 総ページ数:
- 13
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774024 [1566774020]
- 言語:
- 英語
- 請求記号:
- E23400/200319
- 資料種別:
- 国際会議録
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4
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Factors Affecting Stress-Induced Defect Generation in Trenched SOI for High-Voltage Applications
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