Instabilities in GaN based FET Structures - Nature and Alternative Structures *
- 著者名:
Kohn, E. Neuburger, M. Daumiller, I. Krtschil, A. Krost, A. Van Nostrand, J. Jenkins, T. - 掲載資料名:
- State-of-the-art program on compound semiconductors XXXVIII and wide bandgap semiconductors for photonic and electronic devices and sensors III : proceedings of the international symposia
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2003-4
- 発行年:
- 2003
- 開始ページ:
- 174
- 終了ページ:
- 179
- 総ページ数:
- 6
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773492 [1566773490]
- 言語:
- 英語
- 請求記号:
- E23400/200304
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
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4
国際会議録
Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods
Materials Research Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Electrochemical Society |
MRS - Materials Research Society |