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Dislocation Locking by Oxygen in Silicon: New Insights to Oxygen Difflision at Low Temperatures*

著者名:
掲載資料名:
High purity silicon VII : proceedings of the international symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2002-20
発行年:
2002
開始ページ:
171
終了ページ:
182
総ページ数:
12
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773447 [156677344X]
言語:
英語
請求記号:
E23400/200220
資料種別:
国際会議録

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