The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies
- 著者名:
- 掲載資料名:
- Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2001-29
- 発行年:
- 2001
- 開始ページ:
- 75
- 終了ページ:
- 92
- 総ページ数:
- 18
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773638 [1566773636]
- 言語:
- 英語
- 請求記号:
- E23400/200129
- 資料種別:
- 国際会議録
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12
国際会議録
Electrical Performance and Reliability Aspects of Strain Engineered Deep Submicron CMOS Technologies
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