Intermixing of Atoms Across Heterointerfaces in Thin Film Photovoltaic Materials: Nondestructive X-Ray Characterization Using Synchrotron Radiation

Intermixing of Atoms Across Heterointerfaces in Thin Film Photovoltaic Materials: Nondestructive X-Ray Characterization Using Synchrotron Radiation

著者名:

掲載資料名:

Photovoltaics for the 21st century II : proceedings of the international symposium

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

2001-10

発行年:

2001

開始ページ:

349

終了ページ:

361

総ページ数:

13

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566773164 [1566773164]

言語:

英語

請求記号:

E23400/200110

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014013
シリーズID:	PA00000028
会議名:	Symposium on Photovoltaics for the 21st Century ; Meeting of The Electrochemical Society
回次:	2nd ; 199th
会議開催地:	Washington D.C., USA
会議開催年:	2001.03.00

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