Blank Cover Image

Effect of Quantum Confinement in SOI Single-Hole Transistors

著者名:
掲載資料名:
Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2001-3
発行年:
2001
開始ページ:
415
終了ページ:
420
総ページ数:
6
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773096 [1566773091]
言語:
英語
請求記号:
E23400/2001-3
資料種別:
国際会議録

類似資料:

Tang, X., Baje, X., Colinge, J.P., Van de Wide, F., Bayor, V.

Electrochemical Society

Colinge, J P

Electrochemical Society

Colinge, J.P.

Kluwer Academic Publishers

Colinge, J.-P.

Electrochemical Society

Tang, X., Reckinger, N., Bayot, V.

Kluwer Academic Publishers

Colinge, J.P.

Kluwer Academic Publishers

Raskin, J P, Gillon, R, Vonhoenacker, D, Colinge, J P

Electrochemical Society

Paaelinck, P., Vancauwenberghe, O., Van de Wiele, F.

Materials Research Society

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society

11 国際会議録 Models for MOS transistors

WIELE de VAN F.

Sijthoff & Noordhoff International Publishers

Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G.

Electrochemical Society

Colinge, J.-P.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12