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Modular, High Performance BiCMOS by Integration of SiGe:C HBTs *

著者名:
Knoll, D.
Heinemann, B.
Ehwald, K.E.
Rticker, H.
Tillack, B.
Osten, H.J.
さらに 1 件
掲載資料名:
ULSI Process Integration : proceedings of the International Symposium
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
2001-2
発行年:
2001
開始ページ:
165
終了ページ:
177
総ページ数:
13
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773089 [1566773083]
言語:
英語
請求記号:
E23400/2001-2
資料種別:
国際会議録

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