Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
- 著者名:
Cho, C.R. Noh, K.Y. Lee, D.H. Kim, Y.S. Ko, S.W. Kim, C.W. Kim, D.H. Son, C.B. Kim, S.J. Cho, D.H. Choi, J.J. Kim, D.J. Bae, K.M. Rozgonyi, G.A. - 掲載資料名:
- High Purity Silicon VI : proceedings of the sixth International Symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2000-17
- 発行年:
- 2000
- 開始ページ:
- 201
- 終了ページ:
- 208
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772846 [1566772842]
- 言語:
- 英語
- 請求記号:
- E23400/200017
- 資料種別:
- 国際会議録
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