The effects of Matallic Contamination on Gate Oxide Integrity-Ti, W
- 著者名:
Choi, H. Park, C. Yeo, I. Kim, H. Lee, S. Kim, C. - 掲載資料名:
- Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 99-6
- 発行年:
- 1999
- 開始ページ:
- 45
- 終了ページ:
- 49
- 総ページ数:
- 5
- 出版情報:
- Pennington, New Jersey: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772280 [1566772281]
- 言語:
- 英語
- 請求記号:
- E23400/99-6
- 資料種別:
- 国際会議録
類似資料:
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9
国際会議録
Organic Contamination on Si Wafers in Fab Environments and its Effects on Gate Oxide Integrity
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