A Comprehensive Physical Model of Oxide Wearout and Breakdown Explaining the Fluence, Time, Field, and Dependence of Trap Generation Thickness

A Comprehensive Physical Model of Oxide Wearout and Breakdown Explaining the Fluence, Time, Field, and Dependence of Trap Generation Thickness

著者名:

掲載資料名:

Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium

シリーズ名:

Electrochemical Society Proceedings Series

シリーズ巻号:

99-6

発行年:

1999

開始ページ:

11

終了ページ:

25

総ページ数:

15

出版情報:

Pennington, New Jersey: Electrochemical Society

ISSN:

01616374

ISBN:

9781566772280 [1566772281]

言語:

英語

請求記号:

E23400/99-6

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013936
シリーズID:	PA00000028
会議名:	Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
回次:	5th
会議開催地:	Seattle, WA, USA
会議開催年:	1999.05.02-1999.05.07

類似資料:

1 国際会議録 Thickness Dependence of Oxide Wearout Dumin, D.J. Electrochemical Society	7 国際会議録 The Use Of Wearout Measurements To Analyze And Predict TDDB Distributions In Thin Silicon Oxides Dumin, D.J., Mopuri, S., Natarajan, R., Scott, R.S., Subramoniam, R., Lewis, T.G. Electrochemical Society
2 国際会議録 Wearout And Breakdown In Thin Silicon Oxide Dumin, D.J. Electrochemical Society	8 国際会議録 Differentiation Between Electric Breakdowns and Dielectric Breakdown in Thin Silicon Oxides Jackson, J.C., Robinson, T., Oralkan, O., Dumin, D.J., Brown, G.A. Electrochemical Society
3 国際会議録 A Review of Oxide Wearout, Breakdown, and Reliability Dumin, D. Electrochemical Society	9 国際会議録 MEASUREMENT OF HIGH VOLTAGE STRESS INDUCED TRAPS INSIDE THIN SILICON OXIDE FILMS Dumin, D.J., Maddux, J.R. Materials Research Society
4 国際会議録 Voltage And Fluence Dependence Of Stress Generated Traps Inside Thin Silicon Oxide Scott, R.S., Dumin, D.J. Electrochemical Society	10 国際会議録 Evidence For Non-Uniform Trap Distributions In Thin Oxides After High Voltage Stressing Dumin, D.J., Vanchinathan, S., Mopuri, S., Subramoniam, R. Electrochemical Society
5 国際会議録 Traps In Reoxidized Nitrided Oxides Of Varying Thicknesses Natarajan, B., Dumin, D.J. Electrochemical Society	11 国際会議録 The Search for Cathode and Anode Traps in High-Voltage Stressed Sillicon Oxides Chen, L., Kang, C.S., Oralkan, O., Dumin, D.J., Brown, G.A., Bellutti, P. Electrochemical Society
6 国際会議録 VOLTAGE, FLUENCE, AND POLARITY DEPENDENCE OF TRAP GENERATION INSIDE OF THIN SILICON OXIDE FILMS Scott, Ronald S., Dumin, David J. Materials Research Society	12 国際会議録 * MOS CIRCUITS ON SILICON-BORON PHOSPHIDE-SILICON MULTILAYERS Dumin, D.J. Materials Research Society

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