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Observation of an Electron Charging Effect in Si Nanocrystals Embedded in an Ultrathin Gate Oxide

著者名:
掲載資料名:
Proceedings of the Fifth International Symposium on Quantum Confinement : nanostructures
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
98-19
発行年:
1998
開始ページ:
49
終了ページ:
60
総ページ数:
12
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772136 [1566772133]
言語:
英語
請求記号:
E23400/98-19
資料種別:
国際会議録

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