Deep High-Aspect Ratio Si Etching For Advanced Packaging Technologies
- 著者名:
Shul, R.J. Willison, C.G. Sullivan, C.T. Kravitz, S.H. Zhang, L. Zipperian, T.E. - 掲載資料名:
- Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 98-2
- 発行年:
- 1998
- 開始ページ:
- 564
- 終了ページ:
- 572
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771948 [1566771943]
- 言語:
- 英語
- 請求記号:
- E23400/98-2
- 資料種別:
- 国際会議録
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10
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In Situ Monitoring of Etch Byproducts During Reactive Ion Beam Etching of GaAs in Chlorine/Argon
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