Blank Cover Image

Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy

著者名:
Burton, J.C.
Sun, L.
Pophristic, M.
Lukacs, S.
Cohen, S.
Long, F.H.
Liang, S.
Lu, Y.
Feng, Z.C.
Li, Y.
Tran, C.
さらに 6 件
掲載資料名:
Proceedings of the Second Symposium on III-V Nitride Materials and Processes
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
97-34
発行年:
1997
開始ページ:
220
終了ページ:
227
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771870 [1566771870]
言語:
英語
請求記号:
E23400/97-34
資料種別:
国際会議録

類似資料:

1 国際会議録 Spatial Characterization of Doped SiC Wafers

Burton, J. C., Sun, L., Pophristic, M., Li, J., Long, F. H., Feng, Z. C., Ferguson, I.

MRS - Materials Research Society
7 国際会議録 Occurrence of Polytype Transformation during Nitrogen Doping of SiC Bulk Wafer

J. Chen, S.C. Lien, Y.C. Shin, Z.C. Feng, C.H. Kuan

Trans Tech Publications
2 国際会議録 Optical characterization of SiC wafers

Burton, J. C., Pophristic, M., Long, F. H., Ferguson, I.

MRS-Materials Research Society
8 国際会議録 Characterization of Silicon Carbide using Raman Spectroscopy

Burton, J. C., Long, F. H., Khlebnikov, Y., Khlebnikov, I., Parker, M., Sudarshan, T. S.

Trans Tech Publications
3 国際会議録 Disorder in InGaN light-emitting diodes

Pophristic,M., Lukacs,S.J., Long,F.H., Tran,C.A., Ferguson,I.T.

SPIE - The International Society for Optical Engineering
9 国際会議録 Preparation and Characterization of Thermally Expandable Microspheres

S.Y. Chen, Z.C. Sun, L.H. Li

Trans Tech Publications
4 国際会議録 An Investigation of Breakdown Mechanisms in Al(GaN)MSM Photodetectors

Ferguson,I., Liang,S., Tran,C.A., Karlicek,R.F., Feng,Z.C., Lu,Y., Joseph,C.

Trans Tech Publications
10 国際会議録 Reduction of Threading Dislocation Density In AlGaN by Indium Incorporation

Kang, H., Feng, Z.C., Ferguson, I., Guo, S.F., Pophristic, M.

Materials Research Society
5 国際会議録 Growth of III-nitrides for photodetector applications

Ferguson,I., Tran,C.A., Karlicek,R.F., Feng,Z.C., Stall,R.A., Liang,S., Cai,W., Li,Y., Liu,Y., Lu,Y.

SPIE-The International Society for Optical Engineering
11 国際会議録 Time-resolved spectroscopy of InGaN

Pophristic, M., Long, F. H., Tran, C., Ferguson, I. T.

MRS-Materials Research Society
6 国際会議録 Temperature Dependence of Raman Scattering in 4H-SiC

H.Y. Sun, S.C. Lien, Z.R. Qiu, Z.C. Feng

Trans Tech Publications
12 国際会議録 Raman Scattering and X-Ray Absorption from CVD Grown 3C-SiC on Si

Z.C. Feng, C. Chen, Q. Xu, S.P. Mendis, L.Y. Jang

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12