Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy
- 著者名:
Burton, J.C. Sun, L. Pophristic, M. Lukacs, S. Cohen, S. Long, F.H. Liang, S. Lu, Y. Feng, Z.C. Li, Y. Tran, C. - 掲載資料名:
- Proceedings of the Second Symposium on III-V Nitride Materials and Processes
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 97-34
- 発行年:
- 1997
- 開始ページ:
- 220
- 終了ページ:
- 227
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771870 [1566771870]
- 言語:
- 英語
- 請求記号:
- E23400/97-34
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
Trans Tech Publications |
MRS-Materials Research Society |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
Trans Tech Publications |
Trans Tech Publications |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
MRS-Materials Research Society |
Trans Tech Publications |
Trans Tech Publications |