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Impact Ionization Related Phenomena in Si MOSFETs Operated at Cryogenic Temperatures

著者名:
掲載資料名:
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity
シリーズ名:
Electrochemical Society Proceedings Series
シリーズ巻号:
97-2
発行年:
1997
開始ページ:
117
終了ページ:
139
出版情報:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771290 [1566771293]
言語:
英語
請求記号:
E23400/970511
資料種別:
国際会議録

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