Ultrathin Oxide Reliability: Effects of Gate Doping Concentration and Poly-Si/SiO2 Interface Stress Relaxation
- 著者名:
- 掲載資料名:
- The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 96-1
- 発行年:
- 1996
- 開始ページ:
- 744
- 終了ページ:
- 752
- 総ページ数:
- 9
- 出版情報:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771511 [156677151X]
- 言語:
- 英語
- 請求記号:
- E23400/962115
- 資料種別:
- 国際会議録
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